Auger electron analyzer

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• Auger electron spectroscopy — (AES; Auger pronounced|oːʒeː in French) is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science. Underlying the spectroscopic technique is the Auger effect, as it has come… …   Wikipedia

• Low-energy electron diffraction — (LEED) is a technique used to characterize the structures of surfaces.History =Davisson and Germer s discovery of electron diffraction= The development of electron diffraction was closely linked to the progress of quantum mechanics and atomic… …   Wikipedia

• X-ray photoelectron spectroscopy — [ right|thumb|350px|Basic components of a monochromatic XPS system.] X ray photoelectron spectroscopy (XPS) is a quantitative spectroscopic technique that measures the elemental composition, empirical formula, chemical state and electronic state… …   Wikipedia

• surface analysis — ▪ chemistry Introduction       in analytical chemistry (chemistry), the study of that part of a solid that is in contact with a gas or a vacuum. When two phases of matter are in contact, they form an interface. The term surface is usually… …   Universalium

• analysis — /euh nal euh sis/, n., pl. analyses / seez /. 1. the separating of any material or abstract entity into its constituent elements (opposed to synthesis). 2. this process as a method of studying the nature of something or of determining its… …   Universalium

• Low-energy ion scattering — LEIS redirects here; for the Hawaiian garland see Lei (Hawaii). Low energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface sensitive analytical technique used to characterize the …   Wikipedia

• Static secondary ion mass spectrometry — Static secondary ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or… …   Wikipedia

• X-ray fluorescence — (XRF) is the emission of characteristic secondary (or fluorescent) X rays from a material that has been excited by bombarding with high energy X rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis,… …   Wikipedia

• Photoelectric effect — The photoelectric effect is a quantum electronic phenomenon in which electrons are emitted from matter after the absorption of energy from electromagnetic radiation such as x rays or visible light.cite book | title = Physics for Scientists… …   Wikipedia

• Helium atom scattering — (HAS) is a surface analysis technique used in materials science. HAS provides information about the surface structure and lattice dynamics of a material by measuring the diffracted atoms from a monochromatic helium beam incident on the sample.… …   Wikipedia